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Single Event Latchup Estimations

I am trying to determinate SELs due to Heavy Ions for a microcontroller. I have some problem with this calculation because the values are too big.

The RPP model used on the site is really only appropriate for single sensitive volume SEU predictions. There is very little reason to believe that SEL are triggered in the same way. Even if they are, using a per-device cross section as RPP dimensions would create a volume quite large. Since the algorithm is an integration of chord-lengths, it would have very long paths which significantly affects the threshold LET. In other words, I would have no confidence in an SEL rate calculated in this manner. You may be able to bound the answer, but to my knowledge, there is not a good way to predict an SEL rate.
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