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BENDEL: Proton-induced SEE Rate Calculation

Overview

BENDEL outputs the upset rate of a microelectronic device due to nuclear reactions caused by protons. The program integrates the formula of Bendel and Petersen (1983) over the differential energy spectrum of protons.

Inputs

BENDEL options are:

  • Number of points used to calculate the proton energy spectrum
  • The year
  • Whether to include geomagnetic cutoff and trapped protons
  • The interplanetary weather index
  • The thickness of material shielding
  • Either Bendel's 2 parameter A or a measured upset cross-section, in upsets/(bit proton/cm2), at some energy, in MeV.

Outputs

BENDEL uses the same subroutines and data files as SPEC. It outputs upsets/(bit-sec) and upsets/(bit-day).

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